G
graeme210375
I use a Dilog 9083P MFT, which was recently calibrated.
Have just finished extending a ring circuit at a customers house. All testing OK until i used the 'auto test' function to test the 30mA RCD at 5 x IʌN @ 0º, the trip time showed >40mS. All other tests were within limits (5 x IʌN @ 180º was 19mS)
When I manually selected the individual 5 x IʌN @ 0º setting, the trip time was 23mS.
Tried it again on the auto setting and a reading of >40mS was displayed.
Is there something in an auto test function that could cause this?
I'm aware that there can be an anomaly when performing direct Zs readings on some testers with a 'no trip' function, but are there any similar anomalies on the auto test RCD function?
Many thanks
Have just finished extending a ring circuit at a customers house. All testing OK until i used the 'auto test' function to test the 30mA RCD at 5 x IʌN @ 0º, the trip time showed >40mS. All other tests were within limits (5 x IʌN @ 180º was 19mS)
When I manually selected the individual 5 x IʌN @ 0º setting, the trip time was 23mS.
Tried it again on the auto setting and a reading of >40mS was displayed.
Is there something in an auto test function that could cause this?
I'm aware that there can be an anomaly when performing direct Zs readings on some testers with a 'no trip' function, but are there any similar anomalies on the auto test RCD function?
Many thanks